Patrick Toohey is the lead HMI designer in the Mettler Toledo Product Inspection division. He specializes in user interface R&D and is a 12-year veteran with the Hi-Speed checkweigher product line. Since receiving his master’s degree in Human-Computer Interaction from SUNY Oswego in 2016, Toohey has focused primarily on usability research, data visualization design and HMI standardization efforts. Having recently transitioned from New York to Mettler Toledo’s new U.S.-based Product Inspection headquarters in Tampa, Fla., Toohey is currently leading the OMAC HMI standardization effort.