Label Inspection System Created for Speed & Reliability

Confidence is what raises automated industrial systems to whole new levels of productivity, and Omron Microscan Systems Inc. (microscan.com/en-us) is helping manufacturers boost their confidence with a brand-new print quality inspection system that’s as rapid as it is reliable. The LVS-7510 promotes accuracy and data integrity with 100% label inspection that won’t slow the printing process down one millisecond. In fact, this verification product can analyze each and every label even at print rates reaching 254mm (10’’) per second. With 1D/2D barcode verification and validation, blemish detection, data and code matching and numerous other features, the LVS-7510 is the ideal inspection system for consumer goods packaging, medical device manufacturing, pharmaceutical manufacturing, specialty chemical manufacturing and more.

The LVS-7510 helps manufacturers identify defects, control waste, reduce rework and avoid liability thanks to its superior barcode verification and validation features. The system can analyze any combination of 1D and 2D codes and verify them against internationally accepted standards such as those produced by the International Organization for Standardization (ISO). The software displays the overall ISO grade on a real-time graph so that operators can spot trends in print quality throughout a production run of hundreds of labels. The graph will change color as errors arise, and in when a critical error occurs warnings such as light stack illumination, audible alarms and printer stop will occur. The barcode validation feature is much simpler than verification in that it only involves determining whether codes are “readable” and does not grade them according to a standard.

Working in tandem with verification and validation, a blemish detection feature offers extensive capabilities in master to label comparison and print fault identification. It can detect smears, skews, die-cut errors, registration errors and missing information. It even offers a variable data function that prevents expected variations inside the pattern-matching area from being logged as blemishes.